EMS maintains a wide selection of specimen holders and accessories, including those for scanning electron microscopy (SEM). focused ion beam (FIB), and scanning transmission electron microscopy (STEM) analysis. In general, specimen holders are the more complex mechanism that holds the specimen mount in position during imaging and can facilitate specific functions such as rotating, tilting, or adjusting the position of a specimen.
Distinct from standard SEM specimen holders and SEM stub holders, there are several specialized sample holders that offer unique functionality for imaging and analysis, including those designed for use in combined FIB-SEM instruments. FIB sample holders are used in the process of focused ion beam milling, cross-sectioning, and accessing specific areas of interest within the sample, which aids both the current analysis of that specimen as well as its potential preparation for further analysis such as transmission electron microscopy.
FIB sample holders are usually crafted from materials like stainless steel or tungsten, which are resistant to ion beam bombardment and harsh milling conditions. These sample holders also include primary features such as precision motorized stages, tilt and rotational abilities, and compatibility with SEM imaging.
For Hitachi S-800, S-4000, S-4100, S-4200, S-4300, S-4500, S-4700 and S-3600N SEMs. For cross sections up to 6.35 mm ( 1/4"). Available in aluminum or brass with stainless steel allen set screws. Includes allen wrench.
These wafer holders are made from aluminum and feature brass clips which secure the wafers. Each holder comes with a 0.125" (3.2mm) pin of 0.375" (9.5mm) length.
These wafer holders are made from aluminum and feature brass clips which secure the wafers. Each holder comes with a 0.125" (3.2mm) pin of 0.375" (9.5mm) length.
SEM specimen holder for viewing thin samples from paper, plastics, metals, textiles, plants in cross section. Features a wide opening up to 6.4 mm. Grooved head. Machined aluminum with SS screws. 12.7 mm ( 1/2") dia., 3.2 mm ( 1/8") diameter pin.
Split SEM specimen holder opens to 3.75 mm. 15 mm dia with 3.2 mm pin. Pin length is 14.3 mm. Height of head: 10.2 mm, centered split. Pin is off-center. Machined aluminum with 2 stainless steel allen set screws.
SEM specimen holder with two 1 mm by 3 mm deep slots. Clamp thin specimens and cross sections without conductive paint or tape. 3.2 mm pin. Machined aluminum with 2 stainless steel allen set screws.
SEM specimen holder with two 2.5 mm by 5 mm deep slots. Clamp thin specimens and cross sections without conductive paint or tape. 25 x 8 mm with 3.2 mm pin. Machined aluminum with 2 stainless steel allen set screws.
Machined aluminum with stainless steel allen set screws with an open slot that is 10mm (.394") wide x 5mm (.197") deep. It measures 25mm (1") dia. X 17.5mm (0.69") high.
Made from aluminum with copper clips and brass screws. The unit holds a standard geological thin section with 2 clips. The holder has convenient tweezer inserts which allow for easy loading. Measures 55x30x8mm
Vacuum grade aluminum with copper clips and brass screws . The unit measures 51x32x8mm and holds 40x20mm to standard 47 x 27mm slides. 2 clips to insure nothing moves. Holder has convenient tweezer inserts allowing easy loading.
Aluminum with copper clips and brass screws. The unit measures 55x58x8mm and it holds two standard geological thin sections. Convenient tweezer inserts which allow for easy loading. Clips are provided for secure holding.
Made from aluminum with copper clips and brass screws. The unit measures 107x58x8mm and it holds four standard geological thin section. Tweezer inserts enable easy loading. Clips are provided for secure holding.
Holds up to 2 FIB grids of the same thickness. FIB grid holder on a standard 12.7 mm pin stub. Can also be used to safely store FIB grids with thin sections attached. 12.7 mm x 7.8 mm H w/o pin. Vacuum grade aluminum with brass screw.
Holds a FIB sample mounted on two standard 12.7 mm pin stubs for FIB milling and lift-out. Holds two FIB grids close to the sample to prepared TEM lamellae on the FIB grid. Vacuum grade aluminum with brass screws. Includes Philips screwdriver #0.
Holds a FIB sample mounted on two standard 12.7 mm pin stubs for FIB milling and lift-out. Holds two FIB grids close to the sample to prepared TEM lamellae on the FIB grid. Vacuum grade aluminum with brass screws. Includes Philips screwdriver #0.
Larger size holds multiple FIB grids of the same thickness. Can also be used to store FIB grids with thin section (lamellae) attached. Vacuum grade aluminum. Thumbscrews make loading and unloading easy.