Cross line pitch spacing of 463nm with 2160 lines/mm in both directions, cross at 90° for additional accuracy to magnification and aid in distortion checks. Trench-type groove to measure pitch. For electron microsocpe magnification to 80000/100000.
Measuring and correcting astigmatism and for evaluating the resolution of the transmission electron microscope. A thin film of carbon has been treated to obtain numerous round holes of various sizes, on a 3.05mm copper grid.
Holey carbon film support provides holes for ease of focus and astigmatism correction. The dots of evaporated Platinum/Iridium provide dense particles for resolution checks through the particle separation test.
Latex particles with 0.204um diameter are shadowed with a coating of gold. Measure the finest migrated gold particle in the shadow to determine the resolution of the STEM. Mounted on formvar/carbon film copper grid.
Mounted on a grid (3.05mm) and negatively stained, they display very clear lattice plane spacings of approximately 8.75nm and 6.85nm. Ideal for high magnification calibration.
Calibration specimens for TEM and STEM. Resolution of the quad structure of this molecule indicates an instrument resolution better than 1.25nm with a photomicrograph negative magnification of at least 100,000x.
Holey carbon film is shadowed with gold and graphitized carbon particles are deposited on a grid. The gold forms small polycrystalline islands and in which lattice fringes can be used to assess microscope performance.
Crystal lattice plane spacings provide a good test of microscope stability and calibration of magnification in the upper range of magnification since they are accurately known from x-ray measurement.
Image quality, magnification, and instrument stability are assessed with this arrangement of finely-dispersed thin gold particles on carbon film. Superior determination of resolution capabilities.
Uses strong manganese peak to check TEM x-ray detector performace. The 5 manganese disks are packed in a standard grid storage box disk. Each 3 mm discs fit into the sample holder.
Ion milled cross section of a silicon single crystal for all major TEM calibrations. Calibration structure is viewed in a TEM, it appears as a series of light and dark layers where the layer thicknesses are accurately known.