Model IAM-5
Stage Mapping – Grid Pattern
This ideal standard is for verifying or qualifying multiple image analysis parameters such as optical distortion, alignment between systems or optical paths, and cell areas for particle counting. The image area is 20 mm x 50 mm.
Clear Aperture |
Opaque Lines |
Pitch |
8.5 µm square |
1.5 µm square |
10 µm |
Specifications
Overall Size |
1" x 3" (25 mm x 75 mm) |
Image Forming Material |
Negative image/Chrome on glass (NG) |